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News Release 05-120
Field of Beams
Novel system uses polarized light pulses to reveal crop health
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Margaret Ingalls (left) and Steve Finkelman measure the properties of corn leaves using the N-Checker in a field prepared by Tim Smith, a soil scientist at the University of Illinois, Urbana-Champaign.
Credit: Photo by Aaron Woodbury
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Bearing the NSF logo, the original depolarized light-sensor apparatus assesses stressed plant leaves in this controlled greenhouse at the Chicago Botanic Garden under the direction of Louise Egerton Warburton. The researchers have also field tested both systems from cart and body based platforms.
Credit: Steven Finkelman, CRI
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This image shows the first prototye N-Checker sensor components within a protective carrying case.
Credit: Aaron Woodbury
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