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January 6, 2020

Examining crystal sample on atomic force microscope

Georgia Tech graduate research assistant Lee Griffin places a single crystal sample onto the measurement stage of a modified atomic force microscope, used to examine the electromechanical response from the sample.

[Research supported by National Science Foundation grant DMR 1255379.]

Learn more about this research in the Georgia Tech news story When human expertise improves the work of machines. (Date image taken: unknown; date originally posted to NSF Multimedia Gallery: Dec. 2019)

Credit: Rob Felt, Georgia Tech


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