Examining crystal sample on atomic force microscope
Georgia Tech graduate research assistant Lee Griffin places a single crystal sample onto the measurement stage of a modified atomic force microscope, used to examine the electromechanical response from the sample.
[Research supported by National Science Foundation grant DMR 1255379.]
Learn more about this research in the Georgia Tech news story When human expertise improves the work of machines. (Date image taken: unknown; date originally posted to NSF Multimedia Gallery: Dec. 2019)
Credit: Rob Felt, Georgia Tech
Images and other media in the National Science Foundation Multimedia Gallery are available for use in print and electronic material by NSF employees, members of the media, university staff, teachers and the general public. All media in the gallery are intended for personal, educational and nonprofit/non-commercial use only.
Images credited to the National Science Foundation, a federal agency, are in the public domain. The images were created by employees of the United States Government as part of their official duties or prepared by contractors as "works for hire" for NSF. You may freely use NSF-credited images and, at your discretion, credit NSF with a "Courtesy: National Science Foundation" notation.
Additional information about general usage can be found in Conditions.
Download the high-resolution JPG version of the image. (14.4 MB)
Use your mouse to right-click (Mac users may need to Ctrl-click) the link above and choose the option that will save the file or target to your computer.