
NSF Org: |
DMR Division Of Materials Research |
Recipient: |
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Initial Amendment Date: | May 4, 1988 |
Latest Amendment Date: | October 19, 1988 |
Award Number: | 8714476 |
Award Instrument: | Standard Grant |
Program Manager: |
Yvette Jackson
DMR Division Of Materials Research MPS Directorate for Mathematical and Physical Sciences |
Start Date: | May 15, 1988 |
End Date: | April 30, 1990 (Estimated) |
Total Intended Award Amount: | $150,000.00 |
Total Awarded Amount to Date: | $150,000.00 |
Funds Obligated to Date: |
FY 1989 = $130,000.00 |
History of Investigator: |
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Recipient Sponsored Research Office: |
10889 WILSHIRE BLVD STE 700 LOS ANGELES CA US 90024-4200 (310)794-0102 |
Sponsor Congressional District: |
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Primary Place of Performance: |
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Primary Place of
Performance Congressional District: |
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Unique Entity Identifier (UEI): |
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Parent UEI: |
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NSF Program(s): | MPS DMR INSTRUMENTATION |
Primary Program Source: |
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Program Reference Code(s): | |
Program Element Code(s): |
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Award Agency Code: | 4900 |
Fund Agency Code: | 4900 |
Assistance Listing Number(s): | 47.049 |
ABSTRACT
Rutherford Backscattering Spectrometry (RBS) in particular has evolved into major analytical technique for thin film and complements that available from existing instrumentation which emphasizes either bulk characterization or surface analysis. RBS offers good elemental specificity. The compositional information is quantitative and the analysis is nondestructive. The research projects using the instrumentation are quite diverse, and indication of the growing interest in this technique within the materials science community. The major users of the equipment emphasize areas related to thin films, semiconductor materials and interfacial structures. Auxiliary users utilize RBS to characterize the materials and reactions involved in corrosion and segregation processes, in semiconductor technology and in plasma fusion applications. Substantial support from the university and industrial sources will contribute to the purchase of the RBS system.
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