Award Abstract # 1916866
GOALI: Monitoring and Control of Roll-to-Roll Printing of Flexible Electronics through Multiscale In-Line Metrology

NSF Org: CMMI
Division of Civil, Mechanical, and Manufacturing Innovation
Recipient: UNIVERSITY OF MASSACHUSETTS
Initial Amendment Date: August 14, 2019
Latest Amendment Date: July 7, 2022
Award Number: 1916866
Award Instrument: Standard Grant
Program Manager: Andrew Wells
CMMI
 Division of Civil, Mechanical, and Manufacturing Innovation
ENG
 Directorate for Engineering
Start Date: September 1, 2019
End Date: August 31, 2023 (Estimated)
Total Intended Award Amount: $498,764.00
Total Awarded Amount to Date: $590,993.00
Funds Obligated to Date: FY 2019 = $498,764.00
FY 2020 = $7,956.00

FY 2021 = $15,912.00

FY 2022 = $68,361.00
History of Investigator:
  • Xian Du (Principal Investigator)
    xiandu@umass.edu
  • John Berg (Co-Principal Investigator)
Recipient Sponsored Research Office: University of Massachusetts Amherst
101 COMMONWEALTH AVE
AMHERST
MA  US  01003-9252
(413)545-0698
Sponsor Congressional District: 02
Primary Place of Performance: University of Massachusetts Amherst
100 Venture Way
Hadley
MA  US  01035-9450
Primary Place of Performance
Congressional District:
02
Unique Entity Identifier (UEI): VGJHK59NMPK9
Parent UEI: VGJHK59NMPK9
NSF Program(s): AM-Advanced Manufacturing,
GOALI-Grnt Opp Acad Lia wIndus
Primary Program Source: 01002223DB NSF RESEARCH & RELATED ACTIVIT
01001920DB NSF RESEARCH & RELATED ACTIVIT

01002021DB NSF RESEARCH & RELATED ACTIVIT

01002122DB NSF RESEARCH & RELATED ACTIVIT
Program Reference Code(s): 019Z, 081E, 083E, 084E, 116E, 1504, 9178, 9231, 9251
Program Element Code(s): 088Y00, 150400
Award Agency Code: 4900
Fund Agency Code: 4900
Assistance Listing Number(s): 47.041

ABSTRACT

This Grant Opportunities for Academic Liaison with Industry (GOALI) award supports research that contributes novel sensing and control technology for a roll-to-roll printing process, promoting both the invention and manufacturing of revolutionary new flexible electronics products, giving the U.S. a competitive edge in the global economy. Roll-to-roll printing of flexible electronics involves fabricating thin electronic structures ranging in feature size from nanometer to millimeter along a continuously moving flexible substrate at speeds of meters per minute. The roll-to-roll printing technique offers the potential to radically shift the cost structure for large-area nanostructured devices and enables versatile applications of flexible functional systems. However, a limitation of present continuous printing processes is that in-line metrology is unavailable for process monitoring and control. This research establishes a technological base for the development of a multiscale in-line metrology platform. In this study, ultra-thin print patterns along a continuously moving flexible web are imaged, registered and measured in real-time. This process control system can be adapted for different roll-to-roll printing processes for a variety of applications such as industrial internet-of-things and infrastructure health-monitoring. This project involves training students at the industrial partner facility that has roll-to-roll nanomanufacturing capabilities. It incorporates fundamental research results into undergraduate and graduate courses to advance the students' interests and skills in solving practical engineering problems.

Many lab-scale roll-to-roll (R2R) printing processes have been shown to have the ability to print flexible electronics with resolutions ranging from nanometers to millimeters. However, numerous research gaps must be met for these printing processes to be scaled up to industrial scale. The research gaps include invisibility of the ultra-thin patterns in a normal optical imaging environment, loss of pattern registration, optical limits on field-of-view and resolution, and inability of conventional control methods to capture high-order dynamics and nonlinearity in R2R printing processes. To meet these research gaps, this project develops in-line metrology for print pattern quality monitoring of nano-thin monolayer print processes, investigates high-resolution imaging and registration of large-area nano- and micron-scale patterns, and explores the deep-learning-based predictive control of R2R printing processes by integrating in-line multiscale metrology and process modeling. The in-line monolayer pattern is imaged using real-time water vapor condensation figures and synchronous image processing. The predictive model is a recurrent conditional deep predictive neural network that incorporates short-term and long-term nonlinearly dynamic print input-output responses to optimize prediction errors. To address the broad and complex array of problems that are involved in R2R print process control and its scale-up to industrial applications, a close collaboration with the GOALI partner has been established to guide the research efforts and test the in-line metrology platform.

This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

PUBLICATIONS PRODUCED AS A RESULT OF THIS RESEARCH

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DiMeo, Peter and Sun, Lu and Du, Xian "Fast and accurate autofocus control using Gaussian standard deviation and gradient-based binning" Optics Express , v.29 , 2021 https://doi.org/10.1364/OE.425118 Citation Details
Du, Xian and Yan, Jingyang and Ma, Rui "Fault Classification of Nonlinear Small Sample Data through Feature Sub-Space Neighbor Vote" Electronics , v.9 , 2020 https://doi.org/10.3390/electronics9111952 Citation Details
Ma, Rui and Du, Xian "Closed-loop feedback registration for consecutive images of moving flexible targets" Applied Intelligence , 2022 https://doi.org/10.1007/s10489-022-04068-0 Citation Details
Yan, Jingyang and Du, Xian "Real-time web tension prediction using web moving speed and natural vibration frequency" Measurement Science and Technology , v.31 , 2020 https://doi.org/10.1088/1361-6501/aba3f4 Citation Details
Yan, Jingyang and Ma, Rui and Du, Xian "Consistent optical surface inspection based on open environment droplet size-controlled condensation figures" Measurement Science and Technology , 2021 https://doi.org/10.1088/1361-6501/ac0d24 Citation Details
Yau, Henry and Du, Xian "Robust deep learning-based multi-image super-resolution using inpainting" Journal of Electronic Imaging , v.30 , 2021 https://doi.org/10.1117/1.JEI.30.1.013005 Citation Details
Zeng, Dechao and Du, Xian "LED-based Solar Ring Light Simulator on a Measurescope" Adaptive Optics: Analysis, Methods & Systems , 2020 https://doi.org/10.1364/3D.2020.JW2A.2 Citation Details

PROJECT OUTCOMES REPORT

Disclaimer

This Project Outcomes Report for the General Public is displayed verbatim as submitted by the Principal Investigator (PI) for this award. Any opinions, findings, and conclusions or recommendations expressed in this Report are those of the PI and do not necessarily reflect the views of the National Science Foundation; NSF has not approved or endorsed its content.

Flexible electronics (FE) have electronic components and devices for sensing elements, either assembled within or imprinted on the flexible substrate such that they touch the skin or appropriately interface with the body and can be worn on the human body for health monitoring.  The versatility of applications, and the lightweight and compact structure of FE, along with the ever-expanding consumer goods industry, strongly spurred the growth of the FE market and research. The ever-changing FE market demands a high yield and low cost for manufacturing FE products. The emerging roll-to-roll (R2R) FE printing allows millions of nano- or micron-scale patterns to be printed on a continuously moving web across a meter scale width, hence producing a large volume of FE products efficiently. Due to the delicate nature and small scale of the nanomanufacturing process, non-contact optical imaging techniques are an attractive solution for rapidly assessing the online R2R print quality. However, optical limits such as depth of focus, field of view, and resolution, along with challenges such as extremely thin patterns and loss of registration of the pattern hinder the successful implementation of optical imaging for inspecting nanomanufacturing processes. To bridge this gap, we intelligently integrated multimode and multiscale imaging information to monitor and control print pattern quality. We achieved (1) ln-line metrology of print pattern quality in nano-thin monolayer scale using condensation figures (CF), (2) super-resolution and image registration techniques for moving large area nano- and micro-scale flexible patterns, (3) predictive control of roll-to-roll (R2R) printing through neural network (NN) model, and (4) fast and precise autofocus solutions for real-time R2R imaging. The results of the completed research can be applied to predictive regulation of the R2R print process to ensure pattern functionality and integrity.

 

Under the GOALI initiative, this project involved a collaboration of industrial partners from Carpe Diem. Over the past four years, two of our graduate students have undergone comprehensive training by Carpe Diem engineers at the R2R core facility. This training encompassed the design, utilization, and maintenance of a wide array of industrial-scale coating, cleaning, and printing equipment used in the production of industrial goods. During this period, our graduate students have also closely collaborated with Carpe Diem engineers on testing and expanding the applicability of R2R sensing and control algorithms in other R2R printing processes, such as Gravure printing. Additionally, two graduate students were co-supported by this grant and NSF INTERN for an internship at the National Renewable Energy Lab (NREL). They investigated spectrum imaging and deep learning methods for real-time thickness measurement and defect detection on polymer-electrolyte-membrane (PEM) fuel cells that were produced by R2R coating at NREL.

This project aids in the development of metrology and imaging techniques for inline monitoring and quality control of R2R printing processes. This integration of these techniques into the R2R printing process models allows us to: (1) rapidly detect variations in the printed pattern; (2) and take necessary actions to regulate and maintain the desired quality standards. By incorporating these metrology techniques into various R2R print control systems, we have enhanced the efficiency, reliability, and productivity of the printing processes while ensuring high-quality outputs.

 


Last Modified: 12/22/2023
Modified by: Xian Du

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