Award Abstract # 1816263
SaTC: NSF-BSF: CORE: Small: Attacking and Defending the Lifespan of Mobile and Embedded Flash Storage

NSF Org: CNS
Division Of Computer and Network Systems
Recipient: UNIVERSITY OF NORTH CAROLINA AT CHAPEL HILL
Initial Amendment Date: August 24, 2018
Latest Amendment Date: August 24, 2018
Award Number: 1816263
Award Instrument: Standard Grant
Program Manager: Jeremy Epstein
CNS
 Division Of Computer and Network Systems
CSE
 Directorate for Computer and Information Science and Engineering
Start Date: October 1, 2018
End Date: September 30, 2022 (Estimated)
Total Intended Award Amount: $500,000.00
Total Awarded Amount to Date: $500,000.00
Funds Obligated to Date: FY 2018 = $500,000.00
History of Investigator:
  • Donald Porter (Principal Investigator)
    porter@cs.unc.edu
Recipient Sponsored Research Office: University of North Carolina at Chapel Hill
104 AIRPORT DR STE 2200
CHAPEL HILL
NC  US  27599-5023
(919)966-3411
Sponsor Congressional District: 04
Primary Place of Performance: University of North Carolina at Chapel Hill
201 S. Columbia St.
Chapel Hill
NC  US  27599-3175
Primary Place of Performance
Congressional District:
04
Unique Entity Identifier (UEI): D3LHU66KBLD5
Parent UEI: D3LHU66KBLD5
NSF Program(s): Secure &Trustworthy Cyberspace
Primary Program Source: 01001819DB NSF RESEARCH & RELATED ACTIVIT
Program Reference Code(s): 014Z, 022Z, 025Z, 7434, 7923
Program Element Code(s): 806000
Award Agency Code: 4900
Fund Agency Code: 4900
Assistance Listing Number(s): 47.070

ABSTRACT

This project explores approaches to attack and defend the lifespan of flash storage in small mobile devices. While the project focuses on smartphones, the research is applicable to any small flash-based device that allows users to install applications, including smart watches, Internet-of-Things (IoT) devices, computerized medical equipment, and computer-managed critical infrastructure. It is well understood that, over time, writing to flash storage will physically wear out the device. This problem is considered a nonissue with respect to enterprise Solid State Drives (SSDs). However, preliminary findings of this research indicate that wear is unresolved in the context of smartphones. A malicious, unprivileged application can secretly render a phone permanently inoperable in a few short days or weeks, and current mobile systems have no protection against this attack. The risk is exacerbated by the fact that mobile device users typically trust their app store ecosystem and are in the habit of trying out third-party apps with a sense of safety. The goal of this project is to develop ways to alleviate the problem.

Our society is rapidly moving into the era of ubiquitous computing. Users depend on smartphones for wide-ranging aspects (such as commerce, education, and healthcare), and wearables and internet-connected gadgets likewise proliferate. Moreover, an increasing amount of critical infrastructure is internet-connected via small embedded devices, which may thus control physical systems. This research identifies and addresses a critical vulnerability that seriously undermines the ability of users to trust that downloading a new application will not ruin their mobile devices. If unmitigated, this vulnerability might severely hamper the usability of such devices. To address the problem, this project is studying the input/output behavior of mobile devices and applications. Based on this behavioral analysis, the project explores new attacks on and defenses for flash wear. The end goal is to create defenses that are minimally disruptive to end users, yet provide a lower bound on the lifetime expectancy of the device. This work advances the state of the art of operating systems by creating techniques to manage permanently consumable resources.

This award reflects NSF's statutory mission and has been deemed worthy of support through evaluation using the Foundation's intellectual merit and broader impacts review criteria.

PUBLICATIONS PRODUCED AS A RESULT OF THIS RESEARCH

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Zhang, Tao and Pismenny, Boris and Porter, Donald E. and Tsafrir, Dan and Zuck, Aviad "Rowhammering Storage Devices" HotStorage '21: Proceedings of the 13th ACM Workshop on Hot Topics in Storage and File Systems , 2021 https://doi.org/10.1145/3465332.3470871 Citation Details
Zhang, Tao and Zuck, Aviad and Porter, Donald E. and Tsafrir, Dan "Apps Can Quickly Destroy Your Mobile's Flash: Why They Don't, and How to Keep It That Way" MobiSys '19: Proceedings of the 17th Annual International Conference on Mobile Systems, Applications, and Services , 2019 10.1145/3307334.3326108 Citation Details
Zuck, Aviad and Gühring, Philipp and Zhang, Tao and Porter, Donald E. and Tsafrir, Dan "Why and How to Increase SSD Performance Transparency" HotOS '19: Proceedings of the Workshop on Hot Topics in Operating Systems , 2019 10.1145/3317550.3321430 Citation Details

PROJECT OUTCOMES REPORT

Disclaimer

This Project Outcomes Report for the General Public is displayed verbatim as submitted by the Principal Investigator (PI) for this award. Any opinions, findings, and conclusions or recommendations expressed in this Report are those of the PI and do not necessarily reflect the views of the National Science Foundation; NSF has not approved or endorsed its content.

This project investigated techniques for a malicious, but unprivileged application to attack the lifespan of mobile, embedded, and internet-of-things (IoT) devices, such as a smartphone, by wearing out the flash. Although flash wearout is a known issue, it is also considered a solved problem in enterprise-grade SSDs; the project shows that this sense of security does not extend to all flash devices.  The project has yielded several highly visible publications at venues including HotOS, HotStorage and MobiSys.


Intellectual Merit: This award has generated a highly effective attack strategy, wherein an unprivileged application can ``brick'' (or, render unbootable) a range of different smartphones within days or weeks. The project further contributes a substantial dataset and analysis of Android application I/O behaviors, in order to categorize typical and atypical I/O patterns, as well as a proactive wear management scheme that requires minimal user input.  Our techniques show how one can budget wear on a device, even in the presence of misbehaving applications, in order to ensure that the device lasts for its desired lifespan.

Broader Impacts:  The issue of embedded flash wear-out has been highly relevant to computing practice during the life of this grant; for instance, Tesla has issued two recalls for vehicle components that failed due to embedded flash wear-out, Apple's M1 computers have seen wear issues and some SSD manufacturers have declared that certain applications may void the device's warranty. Meta has also requested our materials to develop a training course for engineers working on the Oculus system. Similarly, over the life of this project, Android has added features to help users and developers manage flash lifespan.

The PIs have also continued promoting US-Israel collaboration through regular contributions to the ACM SYSTOR conference (as well as the HotStorage workshop), now held annually in Haifa.


Last Modified: 11/14/2022
Modified by: Donald E Porter

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